摘要
Whenmeasuringresidualstressofcoarse-grainaluminumalloyusingX-raydiffractionmethod,thediffractionprofileshowstwopeaksandpositionofmeasured2dwillbechanged,whichleadtoaninaccuratemeasurementresult.Hence,inthispaper,somemethodswereemployedtoimprovethemeasurementaccuracy.Duringthemeasuringprocess,differentparameters(diameterofirradiatedarea,Ψ-oscillationrangeandexposuretime)wereselectedandprofilepeakshiftmethodwasutilized.Moreover,whenthe20ofprofileswasdetermined,differentcalculationmethodswereusedtocalculatetheresidualstress.TheresultsshowthatdiameterofirradiatedareaandΨ-oscillationrangehavesignificantinfluenceonthemeasuringresult.Forstressvaluecalculateddirectlyfromthetestequipment,crosscorrelationmethodismoreaccuratethantheabsolutepeak.Furthermore,anothertwocalculationmethodsofslopewith2θ-sin~2Ψande-sin~2Ψwereusedtocalculatethestressbasedonparameters(2θ,ε)obtainedfromcrosscorrelationmethod.Itisconcludedthat20-sin~2Ψmethodcanfurtherimprovethemeasurementaccuracy.
出版日期
2016年02月12日（中国期刊网平台首次上网日期，不代表论文的发表时间）
