A Complete Critical Path Algorithm for Test Generation of Combinational Circuits-中国期刊网

摘要 Itisknownthatcriticalpathtestgenerationmethodisnotacompletealgorithmforcombinationalcircuitswithreconvergent-fanout.Inordertomadeitacompletealgorithm,weputforwardareconvergent-fanoutorientedtechnique,theprincipalcriticalpathalgorithm,propagatingthecriticalvaluebacktoprimaryinputsalongasinglepath,theprincipalcriticalpath,andallowingmultiplepathsensitizationifneeded.Relationshipamongtestpatternsisalsodiscussedtoacceleratetestgeneration.

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A Complete Critical Path Algorithm for Test Generation of Combinational Circuits

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A Complete Critical Path Algorithm for Test Generation of Combinational Circuits

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