摘要
Itisknownthatcriticalpathtestgenerationmethodisnotacompletealgorithmforcombinationalcircuitswithreconvergent-fanout.Inordertomadeitacompletealgorithm,weputforwardareconvergent-fanoutorientedtechnique,theprincipalcriticalpathalgorithm,propagatingthecriticalvaluebacktoprimaryinputsalongasinglepath,theprincipalcriticalpath,andallowingmultiplepathsensitizationifneeded.Relationshipamongtestpatternsisalsodiscussedtoacceleratetestgeneration.
出版日期
1991年01月11日(中国期刊网平台首次上网日期,不代表论文的发表时间)