简介:[篇名]ADVANCEDLASERAPPLICATIONSINMICROELECTRONICSANDDATASTORAGEDEVICES(INVITED),[篇名]ANNEALINGTEMPERATUREDEPENDENCEOFCONTACTRESISTANCEANDSTABL1TYFORTi/AI/Pt/AuOHMICCONTACTSTOBULKn=ZaO,[篇名]Applicationsofthermographyintheassessmentofmasonry,airportpavementsandcompositematerials,[篇名]BulkPlasmaProductionUsingGaseousDischargeSystemwithExternalElectronInjection,[篇名]CharacterizationOfNano-MeterScaleRoughnessOfCVDSiliconAndSiliconDioxideFilmsFor3-DDeviceIntegration,[篇名]CLEANINGOFTHESURFACEOFSILICONSTRUCTURESINTHETECHNOLOGYOFVERYLARGE-SCALEINTEGRATEDCIRCUITSWITHTHEUSEOFRAPIDHEATTREATMENT,[篇名]Effectsofactiveelementsonoxideremovalbyavacuumarc。