简介:Small-angleX-rayscattering(SAXS)usingsynchrotronradiationasX-raysourcehasbeenemployedtocharactcizcthemicroscopicstructrureoforgano-modifiedmesoporousmolecularsieves(organo-MSU-X)preparedbyaone-pottemplate-directedsynthesis.ItisshownthattheSAXSprofileishardlyconstantwithPorod’slawshowinganegativeslope,i.e.,negativedeviation.Thissuggeststhatthereisdiffuseinterfaciallayerlocatedbetweentheporesandthematrix.Thissuggeststhattheorganicgroupsremaincovalentlylinkedtothematrix,asindicatedby^29SiCPMASNMRandFT-IR.Theaveragethicknessoftheinterfaciallayerwasfoundtobeabout1nmforeachofthethreesampleswithdifferentkindsandthesameamounts(20?oforganicgroups.Thiskindofmaterialhasalsobeenprovedtopossessbothsurfaceandmassfractalstructureoftheamophousporoussilicamaterials.2001ElsevierScienceB.V.Allrightsreserved.
简介:当散射体系中除散射体外还存在微电子密度起伏时,实测散射强度将形成对Porod定理的正偏离,从而使散射体的散射失真。提出了一种在长狭缝准直条件下应用模糊强度校正正偏离的方法:作出ln[q^3I^-(q)]-q^2曲线,用公式n[q^3I(q)]=InK'+σ^2q^2拟合大波矢区直线,求出斜率σ^2,作出ln[q^3I^-(q)]-σ^2q^2-q^2曲线即为无偏离的Porod曲线,由此曲线再还原出无偏离的散射强度,即I^-'(q)=exp{ln[q^3I^-(q)]-σ^2q^2}/q^3,再以醇热法合成的介孔氧化锆粉体为例进行了讨论。