学科分类
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1 个结果
  • 简介:At-speedtestingusingexternaltesterrequiresanexpensiveequipment,thusbuilt-inself-test(BIST)isanalternativetechniqueduetoitsabilitytoperformon-chipat-speedself-testing.ThemainissueinBISTforat-speedtestingistoobtainhighdelayfaultcoveragewithalowhardwareoverhead.Thispaperpresentsanimprovedloop-basedBISTscheme,inwhichaconfigurableMISR(multiple-inputsignatureregister)isusedtogeneratetest-pairsequences.ThestructureandoperationmodesoftheBISTschemearedescribed.Thetopologicalpropertiesofthestate-transition-graphoftheproposedBISTschemeareanalyzed.Basedonit,anapproachtodesignandefficientlyimplementtheproposedBISTschemeisdeveloped.ExperimentalresultsonacademicbenchmarkcircuitsarepresentedtodemonstratetheeffectivenessoftheproposedBISTschemeaswellasthedesignapproach.

  • 标签: 集成电路 自动检测设备 线路检测